Partial Scan Selection for User-Speci ed Fault Coverage
نویسندگان
چکیده
With current approaches to partial scan, it is di cult, and often impossible, to achieve a speci c level of fault coverage without returning to full scan. In this paper, we introduce a new formulation of the minimum scan chain assignment problem and propose an e ective covering algorithm and test sequence generator SCORCH (Scan Chain Ordering with Reduced Cover Heuristic) to solve it. SCORCH uses a combinational test generator not only to optimize the scan chain assignment, subject to maintaining a user-speci ed level of fault coverage, but also as a basis for the test sequence generation. We report experimental results with minimizedp artial scan assignment and 100% fault coverage for a set of large benchmarks.
منابع مشابه
Partial Scan Selection for User - Speci
IEEE -Preprint from European Design Automation Conference, Brighton, Great Britain, September 18 22, 1995 Partial Scan Selection for User-Speci ed Fault Coverage Clay Gloster Franc Brglez CBL (CAD Benchmarking Laboratory), Department of Electrical & Computer Engineering Box 7911, North Carolina State University, Raleigh, N.C. 27695, U.S.A. (WWW: http://www.cbl.ncsu.edu/www/) Abstract { With cur...
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